Chu-Shik Kang: шукати на сайті Z-Library

Nicolaus, R. Arnold, Kang, Chu-Shik, Boensch, Gerhard, Decker, Jennifer E., Brown, Nicholas

Рік:

2016

Мова:

english

Файл:

PDF, 1.29 MB

english, 2016

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Recent Developments in Optical Gauge Block Metrology - Double-ended Fizeau interferometers with phase-stepping evaluation for measurement of cubes

Рік:

1998

Мова:

english

Файл:

PDF, 849 KB

english, 1998

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Novel interferometer for three-dimensional coordinate measurement of freely moving objects

Kim, Jae Wan, Osten, Wolfgang, Kujawinska, Malgorzata, Kang, Chu-Shik, Eom, Tae Bong, Creath, Katherine

Рік:

2003

Мова:

english

Файл:

PDF, 291 KB

english, 2003

Time-of-flight detection of femtosecond laser pulses for precise measurement of large microelectronic step height

Lu, Xing, Zhang, Shuangyou, Jeon, Chan-Gi, Kang, Chu-Shik, Kim, Jungwon, Shi, Kebin

Журнал:

Optics Letters

Рік:

2018

Мова:

english

Файл:

PDF, 1.63 MB

english, 2018

Metrological atomic force microscope using a large range scanning dual stage

Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Tae Bong Eom

Журнал:

International Journal of Precision Engineering and Manufacturing

Рік:

2009

Мова:

english

Файл:

PDF, 544 KB

english, 2009

Optical gauge block metrology in KRISS

Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, Won-Kyu Lee

Журнал:

Chinese Optics Letters

Рік:

2007

Мова:

english

Файл:

PDF, 288 KB

english, 2007

Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

Jin, Jonghan, Kim, Young-Jin, Kim, Yunseok, Kim, Seung-Woo, Kang, Chu-Shik

Журнал:

Рік:

2006

Мова:

english

Файл:

PDF, 320 KB

english, 2006

A compact system for simultaneous measurement of linear and angular displacements of nano-stages

Kim, Jae-Wan, Kang, Chu-Shik, Kim, Jong-Ahn, Eom, Taebong, Cho, Mijung, Kong, Hong Jin

Журнал:

Рік:

2007

Мова:

english

Файл:

PDF, 294 KB

english, 2007

High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity

Kang, Chu-Shik, Kim, Jong-Ahn, Eom, Tae Bong, Jang, Roma, Park, Hae Yong, Kim, Jae-Wan

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 227 KB

english, 2009

High resolution interferometer with multiple-pass optical configuration

Kim, Jong-Ahn, Kang, Chu-Shik, Kim, Jae-Wan, Kim, Soohyun, Ahn, Jeongho

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 282 KB

english, 2009

A passive method to compensate nonlinearity  in a homodyne interferometer

Ahn, Jeongho, Kim, Jong-Ahn, Kang, Chu-Shik, Kim, Jae Wan, Kim, Soohyun

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 268 KB

english, 2009

Thickness and refractive index measurement of a silicon wafer based on an optical comb

Jin, Jonghan, Kim, Jae Wan, Kang, Chu-Shik, Kim, Jong-Ahn, Eom, Tae Bong

Журнал:

Рік:

2010

Мова:

english

Файл:

PDF, 875 KB

english, 2010

Visibility enhanced interferometer based on an injection-locking technique for low reflective materials

Jin, Jonghan, Kim, Jae Wan, Kang, Chu-Shik, Kim, Jong-Ahn

Журнал:

Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang…

Рік:

2010

Мова:

english

Файл:

PDF, 858 KB

english, 2010

Calibration of angle artifacts and instruments using a high precision angle generator

Журнал:

International Journal of Precision Engineering and Manufacturing

Рік:

2013

Мова:

english

Файл:

PDF, 542 KB

english, 2013

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV - Uncertainty evaluation of the geometrical thickness and refractive index of silicon wafers

Jin, Jonghan, Holst, Gerald C., Krapels, Keith A., Park, Jungjae, Kim, Jae Wan, Kim, Jong-Ahn, Kang, Chu-Shik

Рік:

2013

Мова:

english

Файл:

PDF, 238 KB

english, 2013

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV - Simultaneous measurement of the thickness profile and refractive index distribution of silicon wafers

Park, Jungjae, Holst, Gerald C., Krapels, Keith A., Jin, Jonghan, Kim, Jae Wan, Kang, Chu-Shik, Kim, Jong-Ahn

Рік:

2013

Мова:

english

Файл:

PDF, 470 KB

english, 2013

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry

Kim, Jong-Ahn, Kim, Jae Wan, Eom, Tae Bong, Jin, Jonghan, Kang, Chu-Shik

Журнал:

Рік:

2014

Мова:

english

Файл:

PDF, 1015 KB

english, 2014

Note: High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers

Kim, Jong-Ahn, Kang, Chu-Shik, Jin, Jonghan, Eom, Cheon, Jang, Roma, Kim, Jae Wan

Журнал:

Рік:

2011

Мова:

english

Файл:

PDF, 463 KB

english, 2011

Note: High precision angle generator using multiple ultrasonic motors and a self-calibratable encoder

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan, Bong Eom, Tae

Журнал:

Рік:

2011

Мова:

english

Файл:

PDF, 947 KB

english, 2011

An optical absolute position measurement method using a phase-encoded single track binary code

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan, Bong Eom, Tae

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 2.06 MB

english, 2012

A simple phase-encoding electronics for reducing the nonlinearity error of a heterodyne interferometer

Eom, Tae Bong, Kim, Jong Ahn, Kang, Chu-Shik, Park, Byong Chon, Kim, Jae Wan

Журнал:

Рік:

2008

Мова:

english

Файл:

PDF, 203 KB

english, 2008

Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan, Eom, Tae Bong

Журнал:

Рік:

2013

Мова:

english

Файл:

PDF, 1.27 MB

english, 2013

An interferometric Abbe-type comparator for the calibration of internal and external diameter standards

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Eom, Tae Bong

Журнал:

Рік:

2010

Мова:

english

Файл:

PDF, 1.00 MB

english, 2010

An interferometric calibration system for various linear artefacts using active compensation of angular motion errors

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan, Eom, Tae Bong

Журнал:

Buajarern, Jariya, Kang, Chu-Shik, Kim, Jae Wan

Рік:

2011

Мова:

english

Файл:

PDF, 643 KB

english, 2011

APMP.L-K1: Calibration of gauge blocks by interferometry: Final Report

Fujima, Ichiro, Hirai, Akiko, Matsumoto, Hirokazu, Brown, Nicholas, Gao, Sitian, Singhal, R P, Kang, Chu-Shik, Dahlan, Ahmad Makinudin, Howick, Eleanor, Leng, Tan Siew, Charkkian, Somsak, Thu, Bui Quo

Журнал:

Metrologia

Рік:

2006

Мова:

english

Файл:

PDF, 287 KB

english, 2006

Characteristics of laser scanning confocal microscopes for surface texture measurements

Журнал:

Surface Topography: Metrology and Properties

Рік:

2013

Мова:

english

Файл:

PDF, 776 KB

english, 2013

An optical straightness measurement sensor for the KRISS watt balance

Kang, Chu-Shik, Kim, Jong-Ahn, Jin, Jonghan, Eom, Tae Bong, Kim, Jae Wan

Журнал:

Рік:

2015

Мова:

english

Файл:

PDF, 1.24 MB

english, 2015

A digital signal processing module for real-time compensation of nonlinearity in a homodyne interferometer using a field-programmable gate array

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Eom, Tae Bong, Ahn, Jeongho

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 208 KB

english, 2009

Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process

Jin, Jonghan, Kim, Jae Wan, Kang, Chu-Shik, Kim, Jong-Ahn, Lee, Sunghun

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 922 KB

english, 2012

Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique

Kim, Jong-Ahn, Kang, Chu-Shik, Eom, Tae Bong, Jin, Jonghan, Suh, Ho Suhng, Kim, Jae Wan

Журнал:

Applied Optics

Рік:

2014

Мова:

english

Файл:

PDF, 1.96 MB

english, 2014

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers

Kim, Jae Wan, Lehmann, Peter H., Kim, Jong-Ahn, Jang, Roma, Kang, Chu-Shik

Рік:

2009

Мова:

english

Файл:

PDF, 581 KB

english, 2009

SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Interferometry XIII: Techniques and Analysis - Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

Jin, Jonghan, Kim, Young-Jin, Kim, Yunseok, Kang, Chu-Shik, Kim, Seung-Woo

Рік:

2006

Мова:

english

Файл:

PDF, 556 KB

english, 2006

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Recent Developments in Traceable Dimensional Measurements III - Automatic measurement of gauge blocks by Fourier transforming the scanned interferograms

Kang, Chu-Shik, Decker, Jennifer E., Peng, Gwo-Sheng, Kim, Jae Wan, Suh, Ho Suhng, Lee, Won-Kyu

Рік:

2005

Мова:

english

Файл:

PDF, 407 KB

english, 2005

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Recent Developments in Traceable Dimensional Measurements III - Calibration of two-dimensional nanometer gratings using optical diffractometer and metrological atomic force microscope

Kim, Jong-Ahn, Decker, Jennifer E., Peng, Gwo-Sheng, Kim, Jae Wan, Park, Byong Chon, Eom, Tae Bong, Kang, Chu-Shik

Рік:

2005

Мова:

english

Файл:

PDF, 234 KB

english, 2005

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III - Calibration of integrating sphere system designed for roughness correction in optical calibration of gauge blocks

Kang, Chu-Shik, Duparré, Angela, Singh, Bhanwar, Kim, Jae Wan, Kim, Jong-Ahn, Gu, Zu-Han, Eom, Tae Bong

Рік:

2007

Мова:

english

Файл:

PDF, 364 KB

english, 2007

SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Interferometry VI: Techniques and Analysis - Holographic fringe interpretation by FFT and carrier-fringe method

Ko, Yeong-Uk, Kang, Chu-Shik, Chung, Myung-Sai, Kwon, Young H., Kwon, Osuk Y., Brown, Gordon M., Kujawinska, Malgorzata

Рік:

1993

Мова:

english

Файл:

PDF, 277 KB

english, 1993

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Recent Developments in Traceable Dimensional Measurements III - A novel Michelson interferometer combined with an autocollimator for the simultaneous measurement of linear and angular displacement

Kim, Jae Wan, Decker, Jennifer E., Peng, Gwo-Sheng, Kim, Jong-Ahn, Kang, Chu-Shik, Eom, Tae Bong

Рік:

2005

Мова:

english

Файл:

PDF, 210 KB

english, 2005

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III - Development of a precision dual level stage system for the dimensional metrology of large range surface topography

Kim, Jong-Ahn, Duparré, Angela, Singh, Bhanwar, Kim, Jae Wan, Eom, Tae Bong, Gu, Zu-Han, Kang, Chu-Shik

Рік:

2007

Мова:

english

Файл:

PDF, 693 KB

english, 2007

An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan, Lee, Jae Yong

Журнал:

Рік:

2017

Мова:

english

Файл:

PDF, 7.91 MB

english, 2017

Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan, Eom, Tae Bong

Журнал:

Рік:

2018

Мова:

english

Файл:

PDF, 1.41 MB

english, 2018

Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Jin, Jonghan

Журнал:

Drijarkara, Agustinus Praba, Gebrie, Tadesse Gergiso, Lee, Jae Yong, Kang, Chu-Shik

Рік:

2018

Мова:

english

Файл:

PDF, 1.79 MB

english, 2018

Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer

Журнал:

Рік:

2018

Мова:

english

Файл:

PDF, 1.60 MB

english, 2018

High-resolution angle sensor using multiple peak positions of a double slit interference pattern

Kim, Jong-Ahn, Kim, Jae Wan, Lee, Jae Yong, Kang, Chu-Shik, Jin, Jonghan

Журнал:

Рік:

2019

Мова:

english

Файл:

PDF, 2.04 MB

english, 2019

On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors

Kim, Jong-Ahn, Kim, Jae Wan, Kang, Chu-Shik, Lee, Jae Yong, Jin, Jonghan

Журнал: